Correction of scanning tunnelling microscope tip-height and stage instabilities for improved resolution and SNR.
Combining ADF STEM atom-counting with atomistic modelling for improved catalyst design.
Correcting scan-noise and image-drift to improve both resolution and SNR and simplify image interpretation.
Automated image alignment / stitching for ADF STEM time, focal and camera-length series.
Precise quantification of HAADF STEM data requires accurate mapping of the ADF detector sensitivity