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Click pictures to enlarge:
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- ADF STEM image of [110] oriented Silicon single crystal. Sample-prep: Gareth Hughes.
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- Strontium Titanate Kikuchi Pattern recorded at 200kV.
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- DENS in-situ heating chip loaded with metallic nanoparticles (optical micrograph).
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- STM surface images before and after tip-height and scan-distortion correction (raw data: Matthew Marshall).
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- Polycrystalline gold diffraction pattern recorded at 200kV.
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- ADF STEM image of an Al-alloy precipitate colourised with the shear-strain (Exy) map.
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- ADF detector response scans at various amplifier gain and brightness settings.
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- Single coarsely sampled ADF scan (left), and the final multi-frame digital super-resolution restoration (right).
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- False-colour SEM image of platinum nanoparticles on a TEM grid (raw data: Gareth Hughes).
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- Single-layer graphene imaged by ADF-STEM (collaboration with Colum Ó Laoire & Gerardo Martinez).
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- ADF-STEM image of the edge of a flake of M1 oxide (sample courtesy Doug Buttrey – U. Delaware)
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- ADF STEM image of a low-angle grain boundary in strontium titanate (raw data: Hao Yang).
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- Gold icosahedron nanoparticle in [211] orientation.
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- False colour image of Au nanoparticles on carbon-film TEM grid.
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- False coloured image of Pt nanoparticles on 3D amorphous carbon.
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- Restored ADF STEM image of MgO cube from through-focus acquisition (raw data: Armand Beche).
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- False coloured FFT of a Gold 5-fold decahedral nanoparticle
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- Me operating the Oxford JEOLARM200CF.
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- ADF STEM image of a twinned and ordered PtCo nanoparticle (raw data: Armand Beche).
