Lewys Jones's Research

Quantitative Image Analysis for Materials Science

Gallery

If you would like more information about a particular image, or to use resources for teaching purposes, please contact me.

Click pictures to enlarge:

: Me operating the Oxford JEOLARM200CF.

: ADF detector response scans at various amplifier gain and brightness settings.

: ADF STEM image of an Al-alloy precipitate colourised with the shear-strain (Exy) map.

: Restored ADF STEM image of MgO cube from through-focus acquisition (raw data: Armand Beche).

: Strontium Titanate Kikuchi Pattern recorded at 200kV.

: DENS in-situ heating chip loaded with metallic nanoparticles (optical micrograph).

: Single coarsely sampled ADF scan (left), and the final multi-frame digital super-resolution restoration (right).

: ADF-STEM image of the edge of a flake of M1 oxide (sample courtesy Doug Buttrey – U. Delaware)

: Single-layer graphene imaged by ADF-STEM (collaboration with Colum Ó Laoire & Gerardo Martinez).

$Polycrystalline gold diffraction pattern recorded at 200kV.$: Polycrystalline gold diffraction pattern recorded at 200kV.

: ADF STEM image of a twinned and ordered PtCo nanoparticle (raw data: Armand Beche).

: False colour image of Au nanoparticles on carbon-film TEM grid.

: False-colour SEM image of platinum nanoparticles on a TEM grid (raw data: Gareth Hughes).

: STM surface images before and after tip-height and scan-distortion correction (raw data: Matthew Marshall).

: ADF STEM image of [110] oriented Silicon single crystal. Sample-prep: Gareth Hughes.

: Gold icosahedron nanoparticle in [211] orientation.

: False coloured FFT of a Gold 5-fold decahedral nanoparticle

: False coloured image of Pt nanoparticles on 3D amorphous carbon.

: ADF STEM image of a low-angle grain boundary in strontium titanate (raw data: Hao Yang).

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