Getting the Best from an Imperfect Detector

This poster was first presented at Microscience Microscopy Congress 2014 (MMC2014) describing a new method of quantitative ADF normalisation available a part of the Absolute Integrator analysis package.

[pdf]www.lewysjones.com/uploads/Getting_the_Best_from_an_Imperfect_Detector_POSTER.pdf[/pdf]

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