IOP QITIDD One Day Meeting, 20th July 2012


A poster was presented at the IOP-EMAG one day meeting entitled “Quantitative Measurement of Residual Aberrations in the Aberration-corrected Scanning Transmission Electron Microscope”. Copies of the poster and manuscript are available here.┬áThis special one day meeting was dedicated to Professor Mike Whelan FRS in celebration of his 80th┬áBirthday and was followed by a commemorative dinner in Linacre College.