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Below is a list of recent publications. Most are available from Google Scholar or ResearchGate. PDF copies of all these items are available on request using the contact form. This list is also available at: ORCID iD

“If you can not measure it, you can not improve it.” – Lord Kelvin


Book Chapter:
  • “Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications”, Edited by Alina Bruma, CRC Press (2021). ISBN:9780367197360.
Refereed Journal Articles:
  • “Unlocking the Origin of Compositional Fluctuations in InGaN Light Emitting Diodes”, Tara Mishra et al., Physical Review Materials, 5 (2021). DOI:10.1103/PhysRevMaterials.5.024605.


Refereed Journal Articles:
  • “Development of a Practicable Digital Pulse Read-out for Dark-field STEM”, Tiarnan Mullarkey, Clive Downing & Lewys Jones, Microscopy and Microanalysis (2020). DOI:10.1017/S1431927620024721.
  • “Towards data-driven next-generation transmission electron microscopy”, Spurgeon et al., Nature Materials (2020). DOI:10.1038/s41563-020-00833-z.
  • “Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy”, De Backer et al., Physical Review Letters 124 10 (2020). DOI:10.1103/PhysRevLett.124.106105.
  • “Synthesis of tungsten ditelluride thin films and highly crystalline nanobelts from pre-deposited reactants”, Mc Manus et al., Tungsten (2020). DOI:10.1007/s42864-020-00056-4.
Conference Proceedings:
  • “Retaining Precision at Low-Dose and High-Speed STEM Imaging Conditions”, Tiarnan Mullarkey, Clive Downing & Lewys Jones, Microscopy & Microanalysis (2020). DOI:10.1017/S1431927620023351.
  • “Probing the Dynamics of Topologically Protected Charged Ferroelectric Domain Walls with the Electron Beam at the Atomic Scale”, Michele Conroy et al., Microscopy & Microanalysis (2020). DOI:10.1017/S1431927620023594.
  • “Comparison of Ptychography vs. Center-of-Mass Analysis of Registered 4D-STEM Series”, Benedikt Haas et al., Microscopy & Microanalysis (2020). DOI:10.1017/S1431927620019765.
  • “3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM”, Sandra Van Aert et al., Microscopy & Microanalysis (2020). DOI:10.1017/S1431927620022163.
  • “Focused-probe STEM Ptychography: Developments and Opportunities”, Colum O’Leary et al., Microscopy & Microanalysis (2020). DOI:10.1017/S1431927620014762.


 Refereed Journal Articles:
  • “Interstitial Boron Atoms in Palladium Lattice of Industrial Type of Nano-catalyst: Properties and Structural Modifications”, Chen et al., Journal of the American Chemical Society 141 50 (2019). DOI:10.1021/jacs.9b06120.
  • “Prospect for detecting magnetism of a single impurity atom using electron magnetic chiral dichroism”, Devendra Negi et al., Physical Review B 100 (2019). DOI:10.1103/PhysRevB.100.104434.
  • “Self‐Assembly of Atomically Thin Chiral Copper Heterostructures Templated by Black Phosphorus”, Hannah Nerl et al., Advanced Functional Materials, 1903120 (2019). DOI:10.1002/adfm.201903120.
  • “Control of knock-on damage for 3D atomic scale quantification of nanostructures: Making every electron count in scanning transmission electron microscopy”, Sandra Van Aert, Annick De Backer, Lewys Jones, Gerardo T. Martinez, Armand Béché, and Peter D. Nellist, Physical Review Letters, 122 (2019), DOI:10.1103/PhysRevLett.122.066101.
  • “Targeted T1 MRI contrast enhancement with extraordinarily small CoFe2O4 nanoparticles”, Dominique Piché et al., ACS Applied Materials & Interfaces, 11 7 (2019). DOI: 10.1021/acsami.8b17162.
Conference Proceedings:
  • “Investigating Ferroelectric Domain and Domain Wall Dynamics at Atomic Resolution by TEM/STEM in situ Heating and Biasing”, Michele Conroy et al., Microscopy and Microanalysis (S2) (2019). DOI:10.1017/S1431927619010146.
  • “Quantification of 3D Atomic Structures and Their Dynamics by Atom-Counting from an ADF STEM Image”, Annick De Backer et al., Microscopy and Microanalysis (S2) (2019). DOI:10.1017/S1431927619009772.


 Refereed Journal Articles:
  • “Managing dose-, damage- and data-rates in multi-frame spectrum-imaging”, Lewys Jones, Aakash Varambhia, Richard Beanland, Demie Kepaptsoglou, Ian Griffiths, Akimitsu Ishizuka, Feridoon Azough, Robert Freer, Kazuo Ishizuka, David Cherns, Quentin M. Ramasse, Sergio Lozano-Perez, and Peter D. Nellist, Microscopy, 67 (2018), DOI:10.1093/jmicro/dfx125.
  • “Maximising the resolving power of the scanning tunneling microscope”, Lewys Jones, Shuqiu Wang, Xiao Hu, Shams ur Rahman and Martin R. Castell, Advanced Structural and Chemical Imaging, 4:7 (2018), DOI:10.1186/s40679-018-0056-7.
  • “Proposal for a three-dimensional magnetic measurement method with nanometer spatial resolution”, Devendra Negi, Lewys Jones, Juan-Carlos Idrobo, and Jan Rusz, Physical Review B, 98:17 (2018), DOI:10.1103/PhysRevB.98.174409.
  • “An optical configuration for fastidious STEM detector calibration and the effect of the objective-lens prefield”, Lewys Jones, Aakash Varambhia, Hidetaka Sawada, and Peter D. Nellist, Journal of Microscopy, 270:2 (2018), DOI:10.1111/jmi.12672.
  • “Direct Observation of High Densities of Antisite Defects in Ag2ZnSnSe4“, David Cherns, Ian Griffiths, Lewys Jones, Douglas Bishop, Michael Lloyd and Brian McCandless, ACS Applied Energy Materials, 1:11 (2018), DOI:10.1021/acsaem.8b01274.
  • “Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEM”, Aakash Varambhia, Lewys Jones, Andrew London, Dogan Ozkaya, Peter D. Nellist, Sergio Lozano-Perez, Micron, (in press), DOI:10.1016/j.micron.2018.06.015.
  • “Ideal vs real: Simulated annealing of experimentally derived and geometric platinum nanoparticles”, Tom Ellaby, Jolyon Aarons, Aakash Varambhia, Lewys Jones, Peter Nellist, Doğan Özkaya, Misbah Sarwar, David Thompsett and Chris-Kriton Skylaris, Journal of Physics: Condensed Matter, 30:15 (2018), DOI:10.1088/1361-648X/aab251.
  • “Subsampled STEM-Ptychography”, Andrew Stevens, Hao Yang, Weituo Hao, Lewys Jones, Colin Ophus, Peter D. Nellist and Nigel D. Browning, Applied Physics Letters 113:3 (2018), DOI:10.1063/1.5040496.
Conference Proceedings:
  • “The MTF & DQE of Annular Dark Field STEM: Implications for Low-dose Imaging and Compressed Sensing”, Lewys Jones, Clive Downing, Microscopy and Microanalysis, 24:(S1) (2018), DOI:10.1017/S143192761800288X.
  • “Towards Nanometer-Scale Three-Dimensional Magnetic Studies with Atomic Size Electron Vortex Beams”, Jan Rusz, Devendra Negi, Lewys Jones, Juan-Carlos Idrobo, Microscopy and Microanalysis, 24:(S1) (2018), DOI:10.1017/S1431927618005081.
  • “Exploring the Limits of Focused-Probe STEM Ptychography”, Peter D. Nellist, Gerardo Martinez, Colmn O’Leary, Lewys Jones, Microscopy and Microanalysis, 24:(S1) (2018), DOI:10.1017/S1431927618001447.


 Refereed Journal Articles:
  • “Predicting the oxygen binding properties of platinum nanoparticle ensembles by combining high-precision electron microscopy & DFT”,Jolyon Aarons, Lewys Jones, Aakash Varambhia, Katherine E. MacArthur, Dogan Ozkaya, Misbah Sarwar, Chris-Kriton Skylaris, and Peter D. Nellist, Nano Letters, 17(7) (2017), DOI:10.1021/acs.nanolett.6b04799.
  • “Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities”, Annick De Backer, Lewys Jones, Ivan Lobato, Thomas Altantzis, Bart Goris, Peter D. Nellist, Sara Bals, and Sandra Van Aert, Nanoscale, 9 (2017), DOI:10.1039/c7nr02656k.
  • “Optimising Multi-frame ADF-STEM for High-precision Atomic-resolution Strain Mapping”, Lewys Jones, Sigurd Wenner, Magnus Nord, Per Harald Ninive, Ole Martin Løvvik, Randi Holmestad and Peter D. Nellist, Ultramicroscopy, 179 (2017), DOI:10.1016/j.ultramic.2017.04.007.
  • “Atomic-resolution chemical mapping of ordered precipitates in Al alloys using energy-dispersive X-ray spectroscopy”, Sigurd Wenner, Lewys Jones, Calin D. Marioara, Randi Holmestad, Micron, 96 (2017), DOI: 10.1016/j.micron.2017.02.007.
  • “Hybrid statistics-simulations based method for atom-counting from ADF STEM images”, Annelies De wael, Annick De Backer, Lewys Jones, Peter D. Nellist, Sandra Van Aert, Ultramicroscopy 177 (2017), DOI:10.1016/j.ultramic.2017.01.010.
  • “Route to achieving perfect B-site ordering in double perovskite thin films”, Josée E Kleibeuker, Eun-Mi Choi, Edward D Jones, Tse-Min Yu, Bianca Sala, Belinda A MacLaren, Demie Kepaptsoglou, David Hernandez-Maldonado, Quentin M Ramasse, Lewys Jones, Juri Barthel, Ian MacLaren and Judith L MacManus-Driscoll, NPG Asia Materials, 9 (2017), DOI:10.1038/am.2017.113.
  • “Electrochemical CO Oxidation at Platinum on Carbon Studied Through Analysis of Anomalous In Situ IR Spectra”, Ian McPherson, Philip Ash, Lewys Jones, Aakash Varambhia, Robert Jacobs, and Kylie Vincent, Journal of Physical Chemistry C (in press), DOI:10.1021/acs.jpcc.7b02166.
  • “3D Elemental Mapping with Nanometer Scale Depth Resolution via Electron Optical Sectioning”, Timothy Pennycook, Hao Yang, Lewys Jones, Mariona Cabero, Alberto Rivera-Calzada, Carlos Leon, Maria Varela, Jacobo Santamaria, Peter D. Nellist, Ultramicroscopy 174 (2017), DOI:10.1016/j.ultramic.2016.12.002.
  • “Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution”, Hao Yang, Ian MacLaren, Lewys Jones, Gerardo Martinez, Martin Simson, Martin Huth, Henning Ryll, Heike Soltau, Ryusuke Sagawa, Yukihito Kondo, Colin Ophus, Peter Ercius, Lei Jin, Andras Kovacs & Peter D. Nellist, Ultramicroscopy, 180 (2017) DOI:10.1016/j.ultramic.2017.02.006.
Conference Proceedings:
  • “From High-precision Imaging to High-performance Computing: Leveraging ADF-STEM Atom-counting and DFT for Catalyst Nano-metrology”, Lewys Jones, Jolyon Aarons, Aakash Varambhia, Katherine E. MacArthur, Dogan Ozkaya, Misbah Sarwar, Chris-Kriton Skylaris, Peter D. Nellist, Microscopy and Microanalysis, 23(S1) (2017), DOI:10.1017/S1431927617010066.
  • “Mapping the Chemistry Within, and the Strain Around, Al-alloy Precipitates at Atomic Resolution by Multi-frame Scanning Transmission Electron Microscopy”, Lewys Jones, Sigurd Wenner, Magnus Nord, Per Harald Ninive, Ole Martin Løvvik, Calin D. Marioara, Randi Holmestad and Peter D. Nellist, Microscopy and Microanalysis23(S1) (2017), DOI:10.1017/S1431927617002604.
  • “Quantitative STEM of Catalyst Nanoparticles using ADF Imaging with Simultaneous EDS and EELS Spectroscopy”, Aakash M Varambhia, Lewys Jones, Annick De Backer, Sandra Van Aert, Dogan Ozkaya, Sergio Lozano-Perez, Peter D Nellist, Microscopy and Microanalysis23(S1) (2017), DOI:10.1017/S1431927617010108.
  • “Measuring the Cation and Oxygen Atomic Column Displacement at Picometer Precision”, Yi Wang, Lewys Jones, Benjamin Berkels, Wilfried Sigle and Peter A. van Aken, Microscopy and Microanalysis23(S1) (2017), DOI:10.1017/S1431927617008728.
  • “Towards a Direct Visualization of Charge Transfer in Monolayer Hexagonal Boron Nitride using a Fast Pixelated Detector in the Scanning Transmission Electron Microscope”, G.T. Martinez, T. J. Pennycook, T.C. Naginey, L. Jones, H. Yang, J.R. Yates, R.J. Nicholls, M. Huth, M. Simson, H. Soltau, L. Struder, Y. Kondo, R. Sagawa and P.D. Nellist. Microscopy and Microanalysis23(S1) (2017), DOI:10.1017/S1431927617002860.
  • “Development of Fast Pixelated STEM Detector and its Applications using 4-Dimensional Dataset”, Ryusuke Sagawa, Hao Yang, Lewys Jones, Martin Simson, Martin Huth, Heike Soltau, Peter D. Nellist and Yukihito Kondo, DOI:10.1017/S1431927617000940.
  • “Imaging charge transfer in crystals using electron ptychography”, Peter Nellist, Gerardo Martinez, Timothy Pennycook, Lewys Jones, Hao Yang, Martin Huth, Martin Simson, Heike Soltau, Yukihito Kondo, and Ryusuke Sagawa, Acta Crystallographica Section A: Foundations and Advances,  A73, C121(2017), DOI:10.1107/S2053273317094517.
  • “Electron ptychographic phase imaging using fast pixelated detectors”, Hao Yang, Roberto dos Reis, Gerardo Martinez, Lewys Jones, Martin Simson, Heike Soltau, Yukihito Kondo, Ryusuke Sagawa, Timothy Pennycook, and Peter Nellist, Acta Crystallographica Section A: Foundations and Advances, A73, C1349 (2017), DOI:10.1107/S2053273317082262.
  • “Simultaneous imaging of light and heavy elements at atomic resolution using electron ptychography and fast pixelated detectors”, Hao Yang, Roberto dos Reis, Colin Ophus, Peter Ercius, Gerardo T. Martinez, Lewys Jones, Martin Huth, Martin Simson, Heike Soltau, Yukihito Kondo, Ryusuke Sagawa, Timothy J. Pennycook, and Peter D. Nellist, Acta Crystallographica Section A: Foundations and Advances, A73, a168 (2017), DOI:10.1107/S0108767317098336.


Review Article:
  • “Quantitative ADF STEM: acquisition, analysis and interpretation”, Lewys Jones, IOP Conf. Ser.: Mater. Sci. Eng. 109 012008 (2016), DOI:10.1088/1757-899X/109/1/012008.
Refereed Journal Articles:
    • “Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures”, H. Yang, R.N. Rutte, L. Jones, M. Simson, R. Sagawa, H. Ryll, M. Huth, T.J. Pennycook, H. Soltau, Y. Kondo, B.D. Davis, P.D. Nellist, Nature Communications 7 12532 (2016), DOI:10.1038/ncomms12532.
    • “Direct Observation of Ferroelectric Domain Walls in LiNbO3: Wall-Meanders, Kinks, and Local Electric Charges”, Julie Gonnissen, Dmitry Batuk, Guillaume F. Nataf, Lewys Jones, Artem M. Abakumov, Sandra Van Aert, Dominique Schryvers, Ekhard K. H. Salje, Advanced Functional Materials 26:42 (2016), DOI:10.1002/adfm.201603489.
    • “ADF-STEM Imaging of Nascent Phases and Extended Disorder Within the Mo–V–Nb–Te–O Catalyst System”, T. Vogt, D. A. Blom, L. Jones, D. J. Buttrey, Topics in Catalysis 59:17-18 (2016), DOI:10.1007/s11244-016-0665-0.
    • “Quantifying a Heterogeneous Ru Catalyst on Carbon Black Using ADF STEM”, A. M. Varambhia, L. Jones, A. De Backer, V. T. Fauske, S. Van Aert, D. Ozkaya and P. D. Nellist, Particle & Particle Systems Characterization 33:7 (2016), DOI:10.1002/ppsc.201600067.
    • “Interface-induced Polarization in SrTiO3-LaCrO3 Superlattices”, Ryan B. Comes, Steven R. Spurgeon, Steve M. Heald, Despoina M. Kepaptsoglou, Lewys Jones, Phuong Vu Ong, Mark E. Bowden, Quentin M. Ramasse, Peter V. Sushko, and Scott A. Chambers, Advanced Materials Interfaces 3:10 (2016), DOI:10.1002/admi.201500779.
  • “Maghemite-like regions at the crossing of two antiphase boundaries in doped BiFeO3“, Jalal M. Salih, LiQiu Wang, Quentin M. Ramasse, Lewys Jones, Juri Barthel, Ian M. Reaney, Alan J. Craven & Ian MacLaren, Materials Science and Technology 32:3 (2016) DOI.10.1179/1743284715Y.0000000115.
Conference Proceedings:
  • “New Opportunities in multi-frame STEM Spectroscopy & Fractional Beam-current EELS”, Lewys Jones, Aakash Varambhia, Demie Kepaptsoglou, Quentin Ramasse, Robert Freer, Feridoon Azough, Sergio Lozano-Perez, Richard Beanland, and Peter Nellist, 16th European Microscopy Congress (2016), DOI:10.1002/9783527808465.EMC2016.6336.
  • “Nano-scale strain measurements from high-precision ADF STEM”, Lewys Jones, Aakash Varambhia, Sigurd Wenner, Magnus Nord, Per Harald Ninive, Ole Martin Løvvik, Randi Holmestad, and Peter Nellist, 16th European Microscopy Congress (2016), DOI:10.1002/9783527808465.EMC2016.6864.
  • “Experiment design for quantitative dark field imaging and spectroscopy of catalyst nanoparticles using Scanning Transmission Electron Microscopy (STEM)”, Aakash Varambhia, Lewys Jones, Annick De Backer, Vidar Fauske, Sandra Van Aert, Dogan Ozkaya, Sergio Lozano-Perez, and Peter Nellist, 16th European Microscopy Congress (2016), DOI:10.1002/9783527808465.EMC2016.6164.
  • “Non-destructive nanoparticle characterisation using a minimum electron dose in quantitative ADF STEM: how low can one go?”, Sandra Van Aert, Annick De Backer, Annelies De wael, Lewys Jones, Gerardo T Martinez, Bart Goris, Thomas Altantzis, Armand Béché, Sara Bals, and Peter Nellist, 16th European Microscopy Congress (2016), DOI:10.1002/9783527808465.EMC2016.6196.
  • “Efficient and quantitative phase imaging in two- and three-dimensions using electron ptychography in STEM”, Peter Nellist, Hao Yang, Lewys Jones, Gerardo Martinez, Reida Rutte, Benjamin Davis, Timothy Pennycook, Martin Simson, Martin Huth, Heike Soltau, Lothar Strueder, Ryusuke Sagawa, Yukihito Kondo, and Martin Humphry, 16th European Microscopy Congress (2016), DOI:10.1002/9783527808465.EMC2016.6511.
  • “Monochromated STEM-EELS Analysis of Interface-Induced Polarization in LaCrO3-SrTiO3 Superlattices”, Steven Spurgeon, Despoina Kepaptsoglou, Lewys Jones, Ryan Comes, Quentin Ramasse, Phuong-Vu Ong, Peter Sushko, and Scott Chambers, 16th European Microscopy Congress (2016), DOI:10.1002/9783527808465.EMC2016.6257.
  • “Ptychographic phase reconstruction and aberration correction of STEM image using 4D dataset recorded by pixelated detector”, Ryusuke Sagawa, Hao Yang, Lewys Jones, Martin Simson, Martin Huth, Heike Soltau, Peter Nellist, and Yukihito Kondo, 16th European Microscopy Congress (2016), DOI:10.1002/9783527808465.EMC2016.5291.
  • “Atomic resolution electron microscopy of cobalt ferrite nanoparticles”, Dominique Piché, Juan G Lozano, Aakash Varambhia, Frank Dillon, Lewys Jones, Peter D Nellist, Nicole Grobert, 16th European Microscopy Congress (2016), DOI:10.1002/9783527808465.EMC2016.6724.
  • “STEM optical sectioning for imaging screw dislocation core structures”, David Hernandez-Maldonado, Hao Yang, Lewys Jones, Roman Gröger, Peter B Hirsch, Quentin M Ramasse, and Peter D Nellist, 16th European Microscopy Congress (2016), DOI:10.1002/9783527808465.EMC2016.6722.
  • “Study on the robustness of electron ptychography for phase imaging in the STEM using fast pixelated detectors”, Gerardo Martinez, Hao Yang, Lewys Jones, Martin Simson, Martin Huth, Heike Soltau, Lothar Strüder, Ryuusuke Sagawa, Yukihito Kondo, and Peter Nellist, 16th European Microscopy Congress (2016), DOI:10.1002/9783527808465.EMC2016.6136.
  • “Extending the Limits of Fast Acquisition in TEM Tomography and 4D-STEM”, Martin Simson, Rafal E. Dunin-Borkowski, Robert Hartmann, Martin Huth, Sebastian Ihle, Lewys Jones, Yukihito Kondo, Vadim Migunov, Peter Nellist, Robert Ritz, Henning Ryll, Ryusuke Sagawa, Julia Schmidt, Heike Soltau, Lothar Strüder, and Hao Yang, 16th European Microscopy Congress (2016), DOI:10.1002/9783527808465.EMC2016.5295.
  • “Quantification of ADF STEM Image Data for Nanoparticle Structure and Strain Measurements”, Peter Nellist, Lewys Jones, Aakash Varambhia, Annick De Backer, Sandra Van Aert, and Dogan Ozkaya, Microscopy and Microanalysis, 22(S3) p.896-897 (2016), DOI:10.1017/S1431927616005328.
  • “Phase Imaging in STEM Allowing for Post-Acquisition Aberration Correction and 3D Optical Sectioning using Ptychography Wigner-Distribution Deconvolution”, Hao Yang, Lewys Jones, Reida Rutte, Ben Davis, Timothy Pennycook, Martin Simson, Martin Huth, Heike Soltau, Lothar Strüder, Ryuusuke Sagawa, Yukihito Kondo, and Peter Nellist, Microscopy and Microanalysis, 22(S3) p.508-509 (2016), DOI:10.1017/S1431927616003391.


Refereed Journal Articles:
  • “Smart Align – a new tool for robust non-rigid registration of scanning microscope data”, Lewys Jones, Hao Yang, Timothy Pennycook, Matthew Marshall, Sandra Van Aert, Nigel Browning, Martin Castell and Peter D. Nellist, Advanced Structural and Chemical Imaging 1:8 (2015), DOI: 10.1186/s40679-015-0008-4.
  • “Imaging screw dislocations at atomic resolution by aberration corrected electron optical sectioning”, Hao Yang, Juan Lozano, Timothy Pennycook, Lewys Jones, Peter Hirsch, and Peter Nellist, Nature Communications 6 (7266) (2015), DOI:10.1038/ncomms8266.
  • “Polarization Screening-Induced Magnetic Phase Gradients at Complex Oxide Interfaces”, S.R. Spurgeon, P.V. Balachandran, D.M. Kepaptsoglou, A.R. Damodaran, J. Karthik, S. Nejati, L. Jones, H. Ambaye, V. Lauter, Q.M. Ramasse, K.K.S. Lau, L.W. Martin, J.M. Rondinelli, and M.L. Taheri, Nature Communications 6 (6735), DOI:10.1038/ncomms7735.
  • “Quantitative STEM normalisation: the importance of the electron flux”, G.T. Martinez, L. Jones, A. De Backer, A. Béché, J. Verbeeck, S. Van Aert, & P.D. Nellist, Ultramicroscopy 159:1 (2015) DOI:10.1016/j.ultramic.2015.07.010.
Invited Conference Proceedings:
  • “Towards Statistically Representative Atomic Resolution 3D Nano-metrology for Materials Modelling and Catalyst Design”, Lewys Jones, Katherine E MacArthur, Jolyon Aarons, Chris-Kriton Skylaris, Misbah Sarwar, Dogan Ozkaya, Peter D Nellist, Microscopy and Microanalysis (S3), 21 (2015) DOI:10.1017/S431927615011769.
Refereed Conference Proceedings:
    • “Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits?”, Annick De Backer, Annelies De Wael, Julie Gonnissen, Gerardo Martinez, Armand Béché, Katherine MacArthur, Lewys Jones, Peter Nellist, and Sandra Van Aert, Journal of Physics: Conference Series 644:012034 (2015), DOI:10.1088/1742-6596/644/1/012034.
  • “Quantification of a Heterogeneous Ruthenium Catalyst on Carbon-black using ADF Imaging”, Aakash Varambhia, Lewys Jones, Peter Nellist, Sergio Lozano-Perez, and Dogan Ozkaya, Journal of Physics: Conference Series 644:012035 (2015), DOI:10.1088/1742-6596/644/1/012035.
Conference Proceedings:
  • “Improving the SNR of Atomic Resolution STEM EELS & EDX Mapping while Reducing Beam-damage by using Non-rigid Spectrum-image Averaging”, Lewys Jones, Richard Beanland, Sergio Lozano-Perez, Karim Baba-kishi, Peter D Nellist, Microscopy and Microanalysis, 21(S3) (2015), DOI:10.1017/S1431927615006868.
  • “Opportunities in Angularly Resolved Dark-field STEM using Pixelated Detectors”. Lewys Jones, Hao Yang, Katherine E MacArthur, Henning Ryll, Martin Simson, Heike Soltau, Yukihito Kondo, Ryusuke Sagawa, Hiroyuki Banba, Peter D Nellist, Microscopy and Microanalysis, 21(S3) (2015), DOI:10.1017/S1431927615012830.
  • “STEM Optical Sectioning for Imaging Screw Displacements in Dislocation Core Structures”, Hao Yang, Juan Lozano, Timothy Pennycook, Lewys Jones, Peter Hirsch, and Peter Nellist,  Microscopy and Microanalysis 21(S3) (2015), DOI:10.1017/S1431927615010417.


Refereed Journal Articles:
    • “Rapid Estimation of Catalyst Nanoparticle Morphology and Atomic-Coordination by High-Resolution Z-Contrast Electron Microscopy”, Lewys Jones, Katherine E. MacArthur, Vidar T. Fauske, Antonius T. J. van Helvoort, and Peter D. Nellist. Nano Letters 14(11) (2014), p.6636-6341. DOI:10.1021/nl502762m.
    • “Atomic scale dynamics of a solid state chemical reaction directly determined by annular dark-field electron microscopy”, Timothy J. Pennycook, Lewys Jones, Henrik Pettersson, João Coelho, Megan Canavan, Beatriz Mendoza-Sanchez, Valeria Nicolosi & Peter D. Nellist. Scientific Reports 4 7555 (2014). DOI:10.1038/srep07555.
    • (Cover article) “Three Dimensional Optical Transfer Functions in the Aberration Corrected Scanning Transmission Electron Microscope”, Lewys Jones and Peter D. Nellist. Journal of Microscopy 254 (2014), p.47-64. DOI:10.1111/jmi.12117.
    • “Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting”, A. DeBacker, G.T. Martinez, K.E. MacArthur, L. Jones, A. Béché, P.D. Nellist and S. Van Aert, Ultramicroscopy 151 (2014), p.56-61. DOI:10.1016/j.ultramic.2014.11.028.
    • “Testing the Accuracy of the Two-dimensional Object Model in HAADF STEM”, Lewys Jones and Peter D. Nellist. Micron 63 (2014), p.47-51. DOI:10.1016/j.micron.2013.12.012.
    • “Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution”, Timothy J. Pennycook, Andrew R. Lupini, Hao Yang, Matthew F. Murfitt, Lewys Jones, and Peter D. Nellist. Ultramicroscopy 151 (2015), p.160-167 DOI:10.1016/j.ultramic.2014.09.013.
    • “Scan-noise and Drift Correction in the STEM”, Lewys Jones Microscopy Today22 (2014), p.40-41. DOI:10.1017/S1551929514000376.
  • “WS2 2D Nanosheets in 3D Nanoflowers”, Arunvinay Prabkaran, Frank Dillon, Jodie Melbourne, Lewys Jones, Rebecca J. Nicholls, Jude Britton, Antal A. Koos, Peter D. Nellist and Nicole Grobert  Chem. Commun. 50 (2014), p.12360-62. DOI:10.1039/C4CC04218B.
Extended Conference Proceedings:
  • “Two-dimensional Object Functions and Three-dimensional Illumination Functions: their Validity, Interaction and Utility”, Lewys Jones and Peter D. Nellist, Journal of Physics: Conference Series, 522 012015 (2014), DOI:10.1088/1742-6596/522/1/012015.
  • “How Flat is Your Detector? Non-Uniform Annular Detector Sensitivity in STEM Quantification”, Katherine E. MacArthur, Lewys Jones and Peter D. Nellist Journal of Physics: Conference Series 522 012018 (2014) DOI:10.1088/1742-6596/522/1/012018 (poster).
  • “Structural quantification of nanoparticles by HAADF STEM”, Katherine E. MacArthur, Lewys Jones, Sergio Lozano-Perez, Dogan Ozkaya and Peter D. Nellist,  Journal of Physics: Conference Series 522 012061 (2014), DOI:10.1088/1742-6596/522/1/012061.


Refereed Journal Articles:
  • “Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope”, Lewys Jones and Peter D. Nellist. Microscopy and Microanalysis 19 (2013), p.1050-1060. DOI:10.1017/S1431927613001402.
Invited Conference Proceedings:
  • “Advances in 2D, 3D and 4D STEM Image Data Analysis”, Lewys Jones and Peter D. Nellist Microscopy and Microanalysis 19(S2) (2013), p.770-71. DOI:10.1017/S1431927613005849.
Contributed Conference Proceedings:
  • “Position-sensitive STEM detectors for high-sensitivity phase detection” Timothy J. Pennycook, Lewys Jones and Peter D. Nellist, Microscopy and Microanalysis 19(S2) (2013), p.1180-81, DOI:10.1017/S1431927613007897.
  • “Atomic Scale Dynamics of a Manganese Oxide Phase Change Observed with STEM”, Timothy J. Pennycook, Lewys Jones, Henrik Pettersson, Valeria Nicolosi and Peter D. Nellist, Microscopy and Microanalysis 19(S2) (2013), p.1176-877, DOI:10.1017/S1431927613011379.
  • “Depth Sensitive Atomic Resolution Spectroscopy and Imaging of Highly Strained YSZ/STO Epitaxial Heterostructures”, Timothy J. Pennycook, Lewys Jones, Mariona Cabero, Alberto Ribera-Calzada, Carlos Leon, Maria Varela, Jacobo Santamaria and Peter D. Nellist, Microscopy and Microanalysis 19(S2) (2013), p.538-39, DOI:10.1017/S1431927613004686.


Refereed Conference Proceedings:
    • “Post-processing of STEM Data for Instability and Drift Compensation” Lewys Jones and Peter D. Nellist. Microscopy and Microanalysis 18(S2) (2012) DOI:10.1017/S143192761200801X.
  • “Focal Series Reconstruction in Annular Dark-Field STEM” Lewys Jones and Peter D. Nellist.  Microscopy and Microanalysis 18(S2) (2012) DOI:10.1017/S1431927612007921.
Contributed Conference Proceedings:
    • “A Three-dimensional Investigation of the STEM-probe Sample Interaction by Annular Dark-field Focal Series” Lewys Jones and Peter D. Nellist, (proceedings website).
  • “Post-processing of STEM Data for Instability and Drift Compensation” Lewys Jones and Peter D. Nellist, (proceedings website | poster).


Refereed Conference Proceedings:
    • “STEM Image Post-processing for Instability and Aberration Correction for Transfer Function Extension”, Lewys Jones and Peter D. Nellist. Journal of Physics: Conference Series 371 012001 DOI:10.1088/1742-6596/371/1/012001.
  • “Three-Dimensional Crystal Structure Mapping by Diffractive Scanning Confocal Electron Microscopy (SCEM)”, Lewys Jones, Peng Wang and Peter D. Nellist. Journal of Physics: Conference Series 371 012003 DOI:10.1088/1742-6596/371/1/012003.