Welcome

Hi I’m Lewys Jones, a post-doctoral research associate in the group of Prof. Peter Nellist at the Department of Materials, University of Oxford.

My current research in metrology development is based around exploring the design and function of the aberration-corrected scanning transmission electron microscope (STEM), to improve the analysis of atomic-resolution annular dark-field  (ADF) data and EELS and EDX chemical mapping. Themes include ADF normalisation by detector efficiency, correction of scan-noise and scan-distortion and correction of artefacts in EELS spectra. As part of this research a series of image analysis and processing codes have been written to inspect,  improve and quantify atomic-resolution ADF STEM data.

Interesting applications of quantitative image analysis include three-dimensional nano-metrology, aberration measurement, beam-damage analysis, and high-resolution strain measurement.

Biography

After a first degree in Material Science, I received my PhD from the Department of Materials at the University of Oxford in 2013. This focussed on two themes; scanning stability in the aberration-corrected scanning transmission electron microscope (AC-STEM) and also on applications of focal series of annular dark-field data. In 2014 a software plug-in for Digital Micrograph to correct scan-noise (the Jitterbug software) was launched in collaboration with HREM Research. More recently in 2016, another plug-in to bring fast non-rigid registration to DM was launched (SmartAlign).

I sit on the Editorial Board of the journal Advanced Structural and Chemical Imaging, and have been a Fellow of the Royal Microscopical Society since 2015.